Physical Characterization of Nickel Doped Nanostructured TiO2 Thin Films
| dc.contributor.author | 1Atyaf S. AL Rawas, 2Muna Y.Slewa, 3Ban A. Bader, 4Nadir Fadhil Habubi, 5Sami Salman Chiad | |
| dc.date.accessioned | 2026-03-15T08:43:50Z | |
| dc.date.issued | 2020 | |
| dc.identifier.citation | Journal of Green Engineering (JGE) Volume-10, Issue-9, September 2020 | |
| dc.identifier.uri | https://drcentrallibrary.uomosul.edu.iq/handle/123456789/4060 | |
| dc.language.iso | en | |
| dc.publisher | جامعة الموصل / university of mosul | |
| dc.relation.ispartofseries | 3R | |
| dc.subject | TiO2 thin film | |
| dc.subject | Ni | |
| dc.subject | XRD | |
| dc.subject | AFM | |
| dc.subject | Optical Properties | |
| dc.subject | bandgap | |
| dc.title | Physical Characterization of Nickel Doped Nanostructured TiO2 Thin Films | |
| dc.type | Other |